Scanning Electron Microscope (Hitachi S3200N)

The scanning electron microscope (SEM) has many advantages over traditional microscopes. The SEM has a large depth of field, which allows more of a specimen to be in focus at one time.

The SEM also has much higher resolution, so closely spaced specimens can be magnified at much higher levels. The magnification range of SEM is ~20 to 250,000x, with a practical operational magnification of ~60,000x.

Because the SEM uses electromagnets rather than lenses, the researcher has much more control in the degree of magnification. All of these advantages, as well as the actual strikingly clear images, make the scanning electron microscope one of the most useful instruments in research today.

The HITACHI S3200N has a large specimen chamber, a back scattered electron detector and a variable pressure mode (VP-SEM). This means that the equipment can be operated in either a high vacuum mode (~0.001 Pa) or a low vacuum mode (1 to 270 Pa) allowing the examination of non-conducting samples with no special sample preparation.

The ultra-thin window Energy Dispersive X-ray (EDX) detector makes qualitative/quantitative elemental analysis also possible.

 
SEM and EDS analysis of a metal shard found in an eye.

Explorer Atomic Force Microscopes (AFM)

The Scanning Probe Microscope (SPM) gives three-dimensional analysis of surface properties in the micro and nano metric range. Depending on the princple, the SPM can map topography (AFM and STM), thermal (sThM), electrical (EFM) and magnetic properties (MFM).

Scanners

AFM Nickel grating	AFM/MFM particulate PTCO media